quarta-feira, 12 de agosto de 2009

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology


S. J. B. Reed, «Electron Microprobe Analysis and Scanning Electron Microscopy in Geology»Cambridge University Press ISBN: 052184875X 2006 PDF 206 pages 4.68 MB

The favourable reception given to the first (1996) edition of this book suggests that the joint treatment of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) with a specifically geological slant has been found to serve a useful purpose. It was therefore decided to proceed with this second, revised and updated, edition. The inclusion of both EMPA and SEM can be justified on the grounds that the instruments share much in common and their functions overlap: SEMs fitted with X-ray spectrometers are often used in analytical mode, while EMP instruments, though designed primarily for analysis, also have imaging functions similar to those of the SEM.

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